Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices

The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world unique and complementary techniques for Hirel components characterisation. Part of this capability is the high and low (thermal) energy neutron testing of devices.

[1]  M. Baylac,et al.  Evidence of the Robustness of a COTS Soft-Error Free SRAM to Neutron Radiation , 2014, IEEE Transactions on Nuclear Science.

[2]  R. Velazco,et al.  Accelerator-Based Neutron Irradiation of Integrated Circuits at GENEPI2 (France) , 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).