论文信息 - AFM and STM Characterization of TiO2—Ultrafiltration Membranes

AFM and STM Characterization of TiO2—Ultrafiltration Membranes

Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) were used to investigate the surface of TiO2 ultrafiltration membranes with pore sizes of 10 nm. It is widely accepted that conventional AFM with Si3N4 or Si tips is not able to resolve pores in supported ceramic membranes with a diameter of <40 nm. In this study it should be tested whether it is possible to lower this border for further characterization of nanofiltration membranes. Here we present different ways of imaging and discuss alternative sample preparation techniques.© 1997 John Wiley & Sons, Ltd.

H. Richter | G. Tomandl | D. Beyer

[1] O. Cavalleri,et al. Surface characterization of ceramic membranes by atomic force microscopy , 1994 .

[2] A. K. Fritzsche,et al. The structure and morphology of the skin of polyethersulfone ultrafiltration membranes : a comparative atomic force microscope and scanning electron microscope study , 1992 .

[3] A. K. Fritzsche,et al. The structure of the effective separating layer of asymmetric hollow fiber membranes with graded density skins , 1990 .

[4] R. Schubert,et al. Polymer Filled Porous Glass Plates — A Composite Material for Nonlinear Optics , 1993 .

[5] Paul K. Hansma,et al. Surface pore structures of micro- and ultrafiltration membranes imaged with the atomic force microscope , 1992 .

[6] H. Deckman,et al. Artifacts in Atomic Force Microscopy of Nanoporous and Mesoporous Fiducial Samples , 1992 .