40 Years of Radiation Single Event Effects at the European Space Agency, ESTEC

This summary paper is based on an invited talk given at the Single Event Effects (SEE) Symposium at La Jolla, California, USA on 12 April 2011, titled '40 Years of SEE at ESA/ESTEC' (European Space Agency/European Space Research and Technology Centre). As an historical summary paper covering radiation activities within the ESTEC Components Laboratory, this paper primarily focus on my own SEE experiences and involvement from 1970 to 2010.

[1]  R. Harboe-Sorensen,et al.  The behaviour of measured SEU at low altitude during periods of high solar activity (spacecraft memories) , 1990 .

[2]  I. Thompson,et al.  The Use of an Industrial X-Ray Source for Electronic Component Radiation Effects Work , 1980 .

[3]  L. Adams,et al.  A verified proton induced latch-up in space (CMOS SRAM) , 1992 .

[4]  W. Heinrich,et al.  Investigation of single event effects of high energetic heavy ions , 1991, RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems.

[5]  R Harboe-Sorensen,et al.  A Comparison of Heavy Ion Sources Used in Cosmic Ray Simulation Studies of VLSI Circuits , 1984, IEEE Transactions on Nuclear Science.

[6]  R. Harboe-Sorensen,et al.  Radiation pre-screening of R3000/R3000A microprocessors , 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.

[7]  R. Harboe-Sorensen,et al.  Design, Testing and Calibration of a "Reference SEU Monitor" System , 2005, 2005 8th European Conference on Radiation and Its Effects on Components and Systems.

[8]  R Harboe-Sorensen,et al.  The Technology Demonstration Module On-Board PROBA-II , 2011, IEEE Transactions on Nuclear Science.

[9]  R. Harboe-Sorensen,et al.  A summary of SEU test results using Californium-252 , 1988 .

[10]  J. C. Pickel,et al.  Trends In Susceptibility To Single-Event Upset , 1989 .

[11]  R. Harboe-Sorensen,et al.  The single event upset response of the Analog Devices, ADSP2100A, digital signal processor , 1991 .

[12]  R. Harboe-Sorensen,et al.  The heavy ion irradiation facility at CYCLONE - a dedicated SEE beam line , 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.

[13]  R. Harboe-Sorensen,et al.  Radiation effects testing facility in PSI low energy OPTIS area , 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

[14]  R Harboe-Sorensen,et al.  Investigation of Heavy Particle Induced Latch-Up, Using a Californium-252 Source, in CMOS SRAMs and PROMs , 1984, IEEE Transactions on Nuclear Science.

[15]  R Harboe-Sorensen,et al.  Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-Up in CMOS Memories , 1983, IEEE Transactions on Nuclear Science.

[16]  R. Harboe-Sorensen,et al.  PROBA-II Technology Demonstration Module In-Flight Data Analysis , 2012, IEEE Transactions on Nuclear Science.

[17]  R. H. Sørensen,et al.  Applications of the scanning electron microscope EBIC mode to semiconductor device evaluation and failure analysis , 1980 .

[18]  R. Harboe-Sorensen,et al.  The SEU Risk Assessment of Z80A, 8086 and 80C86 Microprocessors Intended for Use in a Low Altitude Polar Orbit , 1986, IEEE Transactions on Nuclear Science.

[19]  R. Harboe-Sorensen,et al.  Measurements of SEU and total dose in geostationary orbit under normal and solar flare conditions , 1991 .

[20]  R. Harboe-Sorensen,et al.  Single event transient characterisation of analog IC's for ESA's satellites , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

[21]  J. C. Pickel,et al.  Use of CF-252 to Determine Parameters for SEU Rate Calculation , 1985, IEEE Transactions on Nuclear Science.

[22]  R. Harboe-Sorensen,et al.  From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II , 2008, IEEE Transactions on Nuclear Science.

[23]  L. Adams,et al.  Proton induced upsets in the low altitude polar orbit , 1989 .

[24]  R. Harboe-Sorensen,et al.  An Experimental Study of the Effect of Absorbers on the Let of the Fission Particles Emitted by CF-252 , 1985, IEEE Transactions on Nuclear Science.

[25]  J. Cretolle,et al.  Observation and analysis of single event effects on-board the SOHO satellite , 2002 .

[26]  R. Harboe-Sørensen,et al.  Upgrades for the RADEF Facility , 2007, 2007 IEEE Radiation Effects Data Workshop.

[27]  R. Harboe-Sorensen,et al.  Radiation pre-screening of 4 Mbit dynamic random access memories for space application , 1991, RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems.

[28]  R. Harboe-Sorensen,et al.  The SEU and Total Dose Response of the INMOS Transputer , 1987, IEEE Transactions on Nuclear Science.

[29]  R. Harboe-Sørensen,et al.  SEU Measurements Using 252Cf Fission Particles, on CMOS Static RAMs, Subjected to a Continuous Period of Low Dose Rate 60Co Irradiation , 1987, IEEE Transactions on Nuclear Science.