Semiconductor device and semiconductor system

The semiconductor device in response to the test enable signal inversion control signal generator for generating a reverse control signal including the first bit and the second bit from the decoded signal; The second bit of the inversion control the response to the first bit inverts the first bit of the input data to generate a first bit of the first internal data, said input in response to the second bit of the inversion control signal data in the signal by the inversion it includes a first data input for generating a second bit of the first internal data.