Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack
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Nagarajan Raghavan | Michel Bosman | Gang Zhang | Ping Bai | Gang Zhang | K. Pey | P. Bai | N. Raghavan | M. Bosman | Wenhu Liu | Xiang Li | Xing Wu | Xiang Li | Kin-Leong Pey | Xing Wu | Wen-Hu Liu
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