Material Classification Using Raw Time-of-Flight Measurements
暂无分享,去创建一个
Wolfgang Heidrich | Felix Heide | Jonathan Klein | Matthias B. Hullin | Shuochen Su | Robin Swanson | Clara Callenberg | W. Heidrich | Felix Heide | M. Hullin | Jonathan Klein | Shuochen Su | Robin Swanson | C. Callenberg
[1] Ko Nishino,et al. Automatically discovering local visual material attributes , 2015, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
[2] Andrew Zisserman,et al. A Statistical Approach to Material Classification Using Image Patch Exemplars , 2009, IEEE Transactions on Pattern Analysis and Machine Intelligence.
[3] Eric O. Postma,et al. Dimensionality Reduction: A Comparative Review , 2008 .
[4] ZissermanAndrew,et al. A Statistical Approach to Material Classification Using Image Patch Exemplars , 2009 .
[5] Tomohiro Tanikawa,et al. SpecTrans: Versatile Material Classification for Interaction with Textureless, Specular and Transparent Surfaces , 2015, CHI.
[6] Wolfgang Heidrich,et al. Low-budget transient imaging using photonic mixer devices , 2013, ACM Trans. Graph..
[7] Diego Gutierrez,et al. Femto-photography , 2013, ACM Trans. Graph..
[8] Edward H. Adelson,et al. Exploring features in a Bayesian framework for material recognition , 2010, 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition.
[9] Edward H. Adelson,et al. Microgeometry capture using an elastomeric sensor , 2011, SIGGRAPH 2011.
[10] Yoshinori Kobayashi,et al. Object Material Classification by Surface Reflection Analysis with a Time-of-Flight Range Sensor , 2010, ISVC.
[11] Wolfgang Heidrich,et al. Imaging in scattering media using correlation image sensors and sparse convolutional coding. , 2014, Optics express.
[12] Chao Liu,et al. Discriminative illumination: Per-pixel classification of raw materials based on optimal projections of spectral BRDF , 2012, CVPR.
[13] Reinhard Koch,et al. Time-of-Flight and Depth Imaging. Sensors, Algorithms, and Applications , 2013, Lecture Notes in Computer Science.
[14] Chao Liu,et al. Discriminative illumination: Per-pixel classification of raw materials based on optimal projections of spectral BRDF , 2012, 2012 IEEE Conference on Computer Vision and Pattern Recognition.
[15] Reinhard Klein,et al. Solving trigonometric moment problems for fast transient imaging , 2015, ACM Trans. Graph..
[16] Ramesh Raskar,et al. A light transport model for mitigating multipath interference in Time-of-flight sensors , 2015, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
[17] Helmut Fischer,et al. New electro-optical mixing and correlating sensor: facilities and applications of the photonic mixer device (PMD) , 1997, Other Conferences.
[18] Ramesh Raskar,et al. Single view reflectance capture using multiplexed scattering and time-of-flight imaging , 2011, SA '11.
[19] Gaël Varoquaux,et al. Scikit-learn: Machine Learning in Python , 2011, J. Mach. Learn. Res..
[20] Michael Weinmann,et al. A Short Survey on Optical Material Recognition , 2015, Material Appearance Modeling.
[21] Scott Sorensen,et al. Material classification with thermal imagery , 2015, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
[22] Wolfgang Heidrich,et al. Diffuse Mirrors: 3D Reconstruction from Diffuse Indirect Illumination Using Inexpensive Time-of-Flight Sensors , 2014, 2014 IEEE Conference on Computer Vision and Pattern Recognition.
[23] Hang Zhang,et al. Reflectance hashing for material recognition , 2015, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
[24] Pattie Maes,et al. Flexpad: highly flexible bending interactions for projected handheld displays , 2013, CHI.
[25] Geoffrey E. Hinton,et al. ImageNet classification with deep convolutional neural networks , 2012, Commun. ACM.
[26] Michael J. Cree,et al. Separating true range measurements from multi-path and scattering interference in commercial range cameras , 2011, Electronic Imaging.
[27] Mirko Schmidt,et al. SRA: Fast Removal of General Multipath for ToF Sensors , 2014, ECCV.
[28] Frédo Durand,et al. Visual vibrometry: Estimating material properties from small motions in video , 2015, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR).
[29] Barbara Caputo,et al. Class-Specific Material Categorisation , 2005, ICCV.
[30] Matthew O'Toole,et al. Decomposing global light transport using time of flight imaging , 2012, CVPR.