Characterization of process-related interfacial dielectric loss in aluminum-on-silicon by resonator microwave measurements, materials analysis, and imaging
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A. F. Roudsari | J. Bylander | Marcus Rommel | Lert Chayanun | Lunjie Zeng | Eva Olsson | Janka Bizn'arov'a | Per Malmberg | Andreas Nylander | Amr Osman | Pui Lam Tam | August Yurgens