The Electrical Characterization of Semiconductors: Majority Carriers and Electron States

Measurement of resistivity galvanomagnetic effects resistivity and hall effect profiling of non-uniform material capacitance-voltage profiling interpretation of capacitance-voltage profiles deep states in depletion regions deep level transient spectrocopy of majority carrier traps other techniques for study of majority carrier traps thermal emission from minority carrier traps deep state carrier capture cross sections depth profiling of deep states optically induced emission from deep states.