论文信息 - Test features of the HP PA7100LC processor

Test features of the HP PA7100LC processor

The implementation of an 1149.1 compliant test controller for a low cost, high performance CMOS RISC processor is described. The controller includes features to support I/sub DDQ/ test, internal test, a hardware assisted instruction buffer test, and at speed internal state capture.<<ETX>>

Don Douglas Josephson | Daniel J. Dixon | Barry J. Arnold

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