The Impact of Surface Defects on SiC Schottky and Ohmic Contact Formation
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Q. Wahab | S. Tsukimoto | L. Porter | L. Brillson | M. Gao | M. Murakami | R. Okojie | X. Ma | P. Pirouz | T. Onishi | D. Ewing | M. Zhang | T. S. Sudharshan | S. Tumakha
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