论文信息 - Pd-C film growN ON SiO2/Si and Si substrates

Pd-C film growN ON SiO2/Si and Si substrates

In this paper we present results of SEM, XRD and EXAFS studies of palladium-carbon nanostructural films prepared in two-steps method on pure and oxidized silicon substrates. Structural, topographical and morphological differences were found between films deposited on those substrates.

[1] A. Ankudinov,et al. REAL-SPACE MULTIPLE-SCATTERING CALCULATION AND INTERPRETATION OF X-RAY-ABSORPTION NEAR-EDGE STRUCTURE , 1998 .

[2] G. G. Stokes. "J." , 1890, The New Yale Book of Quotations.

[3] Elżbieta Czerwosz,et al. XAFS studies of the short-range order in Ni nanoparticles embedded in carbonacoues matrix , 2009 .