论文信息 - Comprehensive investigation of trap-assisted conduction in ultra-thin SrTiO3 layers

Comprehensive investigation of trap-assisted conduction in ultra-thin SrTiO3 layers

The conduction in thin SrTiO"3 (STO) films has been investigated. Characterization of leakage current as a function of bias, temperature and film thickness indicates field enhanced hopping as the dominating conduction mechanism. The findings were confirmed by photo-conductivity measurements and agree well with simulation results.

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