Extraction and analysis of high-frequency response and impedance of 980-nm VCSELs as a function of temperature and oxide aperture diameter
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Hui Li | James A. Lott | Philip Moser | Dieter Bimberg | Philip Wolf | Gunter Larisch | P. Moser | P. Wolf | G. Larisch | Hui Li | J. Lott | D. Bimberg
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