Evaluation of Test Coverage for Embedded System Testing

In this paper we propose an original approach to the evaluation of test suites for embedded system testing, where the implementation under test (IUT) is embedded in a composite system as a component module. We define a coverage measure based on the identification of the IUT within the test context with respect to observational equivalence at the composite system level. The problem of limited IUT controllability and observability caused by the test context is handled when computing the coverage. The approach is purely functional and only assumes a general fault model where the number of states in the IUT is upper bounded. A tool has been developed and an example is given to illustrate and validate the approach.

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