A 480 fJ/conversion-step 13-bit Resistive Sensor Readout IC with a 1%/V Power Supply Sensitivity

Conventional resistive sensor readout ICs (ROICs) suffer limitations, either because of their high resistive sensor-biasing current consumption or low resolution for jitter-induced noise. To overcome these limitations, a 13-bit resistive sensor ROIC is presented in this work. In the proposed ROIC, which relies on zero-crossing-based circuits (ZCBCs), the current source is used not only to settle the output of the ΔΣ integrator, but also to bias the resistive sensor, and thus avoid implementing a dedicated power-hungry bias current branch. In addition, the oversampled ΔΣ modulation technique guarantees high resolution for the proposed ROIC. A prototype was fabricated using 0.18 μm CMOS technology. The measurement results show the ROIC achieved a 13-bit root-mean-square noise equivalent resolution with an 8 kS/s conversion speed and a 480 fJ/conversion-step figure of merit. Moreover, it has good nonlinearity of less than 250 ppm and a power supply sensitivity of 1%/V.

[1]  Georges G. E. Gielen,et al.  Supply-Noise-Resilient Design of a BBPLL-Based Force-Balanced Wheatstone Bridge Interface in 130-nm CMOS , 2013, IEEE Journal of Solid-State Circuits.

[2]  Hae-Seung Lee,et al.  A 12b, 50 MS/s, Fully Differential Zero-Crossing Based Pipelined ADC , 2009, IEEE Journal of Solid-State Circuits.

[3]  Daniele Marioli,et al.  Oscillator-based interface for measurand-plus-temperature readout from resistive bridge sensors , 2000, IEEE Trans. Instrum. Meas..

[4]  Catherine Dehollain,et al.  A 15 $\mu{\rm W}$ 5.5 kS/s Resistive Sensor Readout Circuit with 7.6 ENOB , 2014, IEEE Transactions on Circuits and Systems I: Regular Papers.

[5]  P. K. Chan,et al.  A Low Energy-Noise 65nm CMOS Switched-Capacitor Resistive-Bridge Sensor Interface , 2017, IEEE Transactions on Circuits and Systems I: Regular Papers.

[6]  Jae-Yoon Sim,et al.  A 0.5V, 11.3-μW, 1-kS/s resistive sensor interface circuit with correlated double sampling , 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference.