论文信息 - Ultraviolet polarimeter for characterization of an imaging spectrometer

Ultraviolet polarimeter for characterization of an imaging spectrometer

A polarimeter for characterization of the instrumental polarization of an imaging UV spectrometer has been designed. In the course of calibrating the polarimeter, the quarter-wave retarders were observed to possess polarization properties other than pure linear retardance. This forced the development of a complex procedure for the calibration of the retarders and a new generalized approach to polarimetric analysis.

Douglas G. Torr | Russell A. Chipman | M. Frank Morgan

[1] Thomas K. Gaylord,et al. Rigorous coupled-wave analysis of metallic surface-relief gratings , 1986 .

[2] Russell A. Chipman,et al. Error analysis of a Mueller matrix polarimeter , 1990 .

[3] Douglas G. Torr,et al. Measurement Of The Instrumental Polarization Of A High Resolution Ultraviolet Spectrometer , 1990, Optics & Photonics.

[4] R. Chipman. Polarization analysis of optical systems , 1989 .

[5] M. Torr,et al. Imaging spectrometer for high resolution measurements of stratospheric trace constituents in the ultraviolet. , 1988, Applied optics.

[6] R. Azzam,et al. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal. , 1978, Optics letters.

[7] Russell A. Chipman,et al. Polarization Aberrations In Optical Systems , 1987, Optics & Photonics.

[8] Russell A. Chipman. Polarization Ray Tracing , 1987, Photonics West - Lasers and Applications in Science and Engineering.