In-situ observations of coupled grain boundary motion

Coupled grain boundary migration and sliding were observed in-situ in Al bicrystals with <112>- and <100>- symmetric tilt grain boundaries by using X-ray diffraction. The motion of the grain boundaries was induced by a shear stress that allows the grain boundaries to move parallel as well as perpendicular to the applied stress. The activation parameters for the coupled motion were determined and compared with experimental results of the pure migration process under the influence of a mechanical stress. The measured ratios of the displacements of the migration and sliding were also compared with results of simulations of the coupled grain boundary motion.

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