Optical monitoring of technological parameters during molecular-beam epitaxy
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V. G. Remesnik | A. V. Goryunov | A. Luk'yanov | P. Volkov | N. Mikhailov | D. Yurasov | A. Novikov | N. Baidakova | A. Tertyshnik | V. Kuzmin
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V. G. Remesnik | A. V. Goryunov | A. Luk'yanov | P. Volkov | N. Mikhailov | D. Yurasov | A. Novikov | N. Baidakova | A. Tertyshnik | V. Kuzmin