Stable bit formation in polyimide Langmuir–Blodgett film using an atomic force microscope

Nanometer scale recording bits were stably fabricated in polyimide (PI) Langmuir–Blodgett (LB) films on atomically flat Au (111) surfaces using an atomic force microscope (AFM). The bits are written by voltage application through the AFM probe only until the conductance increases. This method eliminates the influence of the variation in the transition time and therefore the degradation of the tip of the probe. 1 Mbit stable writing can be realized. The overall error rate is less than 2×10−3. The results show that an AFM based memory system with PI LB films is a hopeful candidate to realize a scanning probe microscope based memory system.

[1]  Sumio Hosaka,et al.  Fabrication of nanostructures using scanning probe microscopes , 1995 .

[2]  Ken Eguchi,et al.  Nanometer scale conductance change in a Langmuir‐Blodgett film with the atomic force microscope , 1996 .

[3]  J. Weiner,et al.  Fundamentals and applications , 2003 .

[4]  Calvin F. Quate,et al.  Charge storage in a nitride‐oxide‐silicon medium by scanning capacitance microscopy , 1991 .

[5]  Kazuhiko Matsumoto,et al.  Terabit-per-square-inch data storage with the atomic force microscope , 1999 .

[6]  Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air , 1993 .

[7]  Hongjun Gao,et al.  Nanometer‐scale recording on an organic‐complex thin film with a scanning tunneling microscope , 1996 .

[8]  Ryo Kuroda,et al.  Information storage using conductance change of Langmuir–Blodgett film and atomic force microscope/scanning tunneling microscope , 1996 .

[9]  Thomas W. Kenny,et al.  Ultrahigh-density atomic force microscopy data storage with erase capability , 1999 .

[10]  Ryo Kuroda,et al.  Writing and reading bit arrays for information storage using conductance change of a Langmuir–Blodgett film induced by scanning tunneling microscopy , 1997 .

[11]  E. Kishi,et al.  Switching and memory phenomena in Langmuir–Blodgett films with scanning tunneling microscope , 1992 .

[12]  H. Kado,et al.  NANOMETER-SCALE RECORDING ON CHALCOGENIDE FILMS WITH AN ATOMIC FORCE MICROSCOPE , 1995 .

[13]  D. Rugar,et al.  Thermomechanical writing with an atomic force microscope tip , 1992 .