论文信息 - Growth and reliability of thick gate oxide in U-trench for power MOSFETs - 字舞流文

Growth and reliability of thick gate oxide in U-trench for power MOSFETs

S. A. Suliman | O. Awadelkarim | C.-T. Wu | J. Ruzyllo | G. Dolny | C. M. Knoedler | R. Ridley | T. Grebs | B. Venkataraman