S-자동차 부품 물류센터에서 오더픽킹 작업능력 향상을 위한 연구
暂无分享,去创建一个
[1] Salvador Mir,et al. Unified built-in self-test for fully differential analog circuits , 1996, J. Electron. Test..
[2] Salvador Mir,et al. A digital bist for a 16-bit audio sigma-delta analogue-to-digital converter , 2005 .
[3] H. G. Kerkhoff. Microsystem Testing: Challenge Or Common Knowledge , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).
[4] Andras Poppe,et al. A Scalable Multi-Functional Thermal Test Chip Family: Design and Evaluation , 2001 .
[5] Salvador Mir,et al. Fault-based testing and diagnosis of balanced filters , 1996 .
[6] Salvador Mir,et al. Building an analogue fault simulation tool and its application to MEMS , 2003, Microelectron. J..
[7] Salvador Mir,et al. On-chip test signal generation for acoustic and ultrasound microelectronic interfaces , 2002 .
[8] Salvador Mir,et al. Characterization and testing of MEMS nonlinearities , 2006 .
[9] Salvador Mir,et al. Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets , 1996, J. Electron. Test..
[10] Salvador Mir,et al. Evaluation of test measures for low-cost LNA production testing , 2006 .
[11] Salvador Mir,et al. Design of self-checking fully differential circuits and boards , 2000, IEEE Trans. Very Large Scale Integr. Syst..
[12] Salvador Mir,et al. CAT platform for analogue and mixed-signal test evaluation and optimization , 2006, VLSI-SoC.
[13] A. Bounceur,et al. Estimation of test metrics for multiple analogue parametric deviations , 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..