S-자동차 부품 물류센터에서 오더픽킹 작업능력 향상을 위한 연구

S-Distribution Center supplies parts to three plants of K-automobile manufacturing company. Since the threeplants employ the JIT production system, it is important for S-Distribution Center to deliver small quantities ofparts frequently and quickly on time. This paper presents a case study on the im...

[1]  Salvador Mir,et al.  Unified built-in self-test for fully differential analog circuits , 1996, J. Electron. Test..

[2]  Salvador Mir,et al.  A digital bist for a 16-bit audio sigma-delta analogue-to-digital converter , 2005 .

[3]  H. G. Kerkhoff Microsystem Testing: Challenge Or Common Knowledge , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

[4]  Andras Poppe,et al.  A Scalable Multi-Functional Thermal Test Chip Family: Design and Evaluation , 2001 .

[5]  Salvador Mir,et al.  Fault-based testing and diagnosis of balanced filters , 1996 .

[6]  Salvador Mir,et al.  Building an analogue fault simulation tool and its application to MEMS , 2003, Microelectron. J..

[7]  Salvador Mir,et al.  On-chip test signal generation for acoustic and ultrasound microelectronic interfaces , 2002 .

[8]  Salvador Mir,et al.  Characterization and testing of MEMS nonlinearities , 2006 .

[9]  Salvador Mir,et al.  Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets , 1996, J. Electron. Test..

[10]  Salvador Mir,et al.  Evaluation of test measures for low-cost LNA production testing , 2006 .

[11]  Salvador Mir,et al.  Design of self-checking fully differential circuits and boards , 2000, IEEE Trans. Very Large Scale Integr. Syst..

[12]  Salvador Mir,et al.  CAT platform for analogue and mixed-signal test evaluation and optimization , 2006, VLSI-SoC.

[13]  A. Bounceur,et al.  Estimation of test metrics for multiple analogue parametric deviations , 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..