Bridging fault diagnosis in the absence of physical information
暂无分享,去创建一个
Kenneth M. Butler | Tracy Larrabee | F. Joel Ferguson | Jayashree Saxena | David B. Lavo | Brian Chess
[1] F. Joel Ferguson,et al. Carafe: an inductive fault analysis tool for CMOS VLSI circuits , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.
[2] Peter C. Maxwell,et al. Better models or better algorithms? techniques to improve fault diagnosis , 1995 .
[3] B. Chess,et al. Diagnosis of realistic bridging faults with single stuck-at information , 1995, Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).
[4] John Paul Shen,et al. Extraction and simulation of realistic CMOS faults using inductive fault analysis , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.
[5] R. L. Wadsack,et al. Fault modeling and logic simulation of CMOS and MOS integrated circuits , 1978, The Bell System Technical Journal.
[6] S.D. Millman,et al. Diagnosing CMOS bridging faults with stuck-at fault dictionaries , 1990, Proceedings. International Test Conference 1990.
[7] Sreejit Chakravarty,et al. An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits , 1993, 30th ACM/IEEE Design Automation Conference.
[8] John Paul Shen,et al. Inductive Fault Analysis of MOS Integrated Circuits , 1985, IEEE Design & Test of Computers.
[9] C. C. Beh,et al. Do Stuck Fault Models Reflect Manufacturing Defects? , 1982, ITC.
[10] John M. Acken,et al. Fault Model Evolution For Diagnosis: Accuracy vs Precision , 1992, 1992 Proceedings of the IEEE Custom Integrated Circuits Conference.
[11] F. Brglez,et al. A neutral netlist of 10 combinational benchmark circuits and a target translator in FORTRAN , 1985 .
[12] F. Joel Ferguson,et al. Sandia National Labs , 2022 .
[13] Sreejit Chakravarty,et al. Algorithms for IDDQ measurement based diagnosis of bridging faults , 1992, J. Electron. Test..
[14] Tracy Larrabee,et al. Beyond the byzantine generals: unexpected behavior and bridging fault diagnosis , 1996, Proceedings International Test Conference 1996. Test and Design Validity.
[15] Yves Crouzet,et al. Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability , 1980, IEEE Transactions on Computers.
[16] Sreejit Chakravarty,et al. Which Set of Bridging Faults Should Test Compilers Target , 1996 .