Factors influencing glass formation in rapidly solidified Si,Ge–Ni and Si,Ge–Ni–Nd alloys
暂无分享,去创建一个
[1] A. Inoue,et al. Electronegativity of the constituent rare-earth metals as a factor stabilizing the supercooled liquid region in Al-based metallic glasses , 2001 .
[2] K. Hashimoto,et al. Amorphous and nanocrystalline materials : preparation, properties, and applications , 2001 .
[3] A. Inoue. Stabilization of metallic supercooled liquid and bulk amorphous alloys , 2000 .
[4] A. Inoue,et al. The structure and phase transformation behavior of rapidly solidified alloys in the Ge–Al–La system , 1999 .
[5] Y. Waseda,et al. Structural Study of Amorphous Ge50Al40Cr10Alloy , 1999 .
[6] A. Inoue,et al. Influence of Rare Earth Metals (RE) on Formation Range and Structure of Amorphous Phase in Ge–Al–Cr–RE System , 1999 .
[7] A. Inoue,et al. Production of Si55 Al20 Fe10 Ni5 Cr5 Zr5 bulk amorphous alloy by hot pressing , 1999 .
[8] A. Inoue,et al. The influence of cooling rate on the formation of an amorphous phase in Si-based multicomponent alloys and its thermal stability , 1999 .
[9] A. Inoue,et al. Formation of nanocrystalline nuclei in the amorphous phase of Ge55Al30Cr10Y5 alloy , 1999 .
[10] A. Inoue,et al. Ge-Al-Cr-La amorphous alloys containing crystalline-like zones , 1999 .
[11] A. Inoue,et al. Multicomponent Si-based amorphous alloys produced by melt spinning and their crystallization behaviour , 1997 .
[12] A. Inoue. High strength bulk amorphous alloys with low critical cooling rates (overview) , 1995 .
[13] A. M. James,et al. Macmillan's Chemical and Physical Data , 1992 .
[14] G. J. Morgan. Physics of amorphous materials: S R Elliott Longman, Harlow, UK, 1990, 481 pages, £19.95 ISBN 0 582 02160 X , 1991 .
[15] A. Inoue,et al. Compositional range, thermal stability, hardness and electrical resistivity of amorphous alloys in Al-Si (or Ge)-transition metal systems , 1988 .
[16] Lawrence H. Bennett,et al. Binary alloy phase diagrams , 1986 .
[17] J. B. Hull,et al. A non-crystalline phase in splat-quenched germanium , 1973 .
[18] S. C. Moss,et al. Evidence of Voids Within the As-Deposited Structure of Glassy Silicon , 1969 .