A macroscopic approach to near-field optical microscopy

Abstract A macroscopic theory for scanning optical near field microscopy is presented. The theory, based upon the Rayleigh method, solves rigorously the electromagnetic field near a multilayer system with arbitrary one-dimension structure on its interfaces. The method is suitable for both s- and p-polarized incident light. It may also apply in cases where the resonances in the system, such as the plasmon in a metallic sample, become important.