The effect of electric field on mechanical strain and stress in flawed electroceramics

Abstract Electrically-induced strains and stresses in ceramic transducers and capacitors play an important role in the degradation and breakdown of these components. A computer program based on a finite difference numerical technique was used to model the electric potential and electric field near internal flaws in the ceramic.1 Using the piezoelectric and electrostrictive moduli of Pb(Zr, Ti)O3 and BaTiO3, maximum strains and stresses near cracks, delaminations, and voids were evaluated.2 Predictions are made concerning the nature of field-induced cracks emanating from macrodefects.