Cumulative conformance count chart with sequentially updated parameters

The Cumulative Conformance Count (CCC) chart has been used for monitoring processes with a low percentage of nonconforming items. However, previous work has not addressed the problem of establishing the chart when the parameter is estimated with a prescribed sampling scheme. This is a prevalent problem in statistical process control where the true values of the process parameters are not known but it is desired to determine if there have been drifts since process start-up. This situation is also not well-covered by the conventional CCC chart, which generally assumes known process parameters. In this paper, we examine a sequential sampling scheme for a CCC chart that arises naturally in practice and investigate the performance of the chart constructed using an unbiased estimator of the percent nonconforming, p. In particular, we examine the false alarm rate and its intended target as well as deriving the mean and standard deviation of the run length; and compare the performance with that established under a binomial sampling scheme. We then propose a scheme for constructing the CCC chart in which the estimated p can be updated and the control limits are revised so that not only the in-control average run length of the chart is always a constant but it is also the largest which is not the case for the CCC chart even when the true p is known. It is shown that the proposed scheme performs well in detecting process changes, even in comparison with the often utopian situation in which the process parameter, p, is known exactly prior to the start of the CCC chart.

[1]  W. John Braun Run length distributions for estimated attributes charts , 1999 .

[2]  Marion R. Reynolds,et al.  Shewhart x-charts with estimated process variance , 1981 .

[3]  Thong Ngee Goh,et al.  Some procedures for decision making in controlling high yield processes , 1992 .

[4]  Thong Ngee Goh,et al.  The use of probability limits for process control based on geometric distribution , 1997 .

[5]  T. Calvin,et al.  Quality Control Techniques for "Zero Defects" , 1983 .

[6]  Elisabeth J. Umble,et al.  Cumulative Sum Charts and Charting for Quality Improvement , 2001, Technometrics.

[7]  Subhabrata Chakraborti Run length, average run length and false alarm rate of shewhart x-bar chart: exact derivations by conditioning , 2000 .

[8]  Enrique Del Castillo Run length distributions and economic design of % MathType!MTEF!2!1!+-% feaafiart1ev1aaatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbuLwBLn% hiov2DGi1BTfMBaeXatLxBI9gBaerbd9wDYLwzYbItLDharqqtubsr% 4rNCHbGeaGqiVu0Je9qqqrpepC0xbbL8F4rqqrFfpeea0xe9Lq-Jc9% vqaqpepm0xbba9pwe9Q8fs0-yqaqpepae9pg0FirpepeKkFr0xfr-x% fr-x , 1996 .

[9]  Gemai Chen,et al.  The run length distributions of the R, s and s2 control charts when is estimated , 1998 .

[10]  Thong Ngee Goh,et al.  ON OPTIMAL SETTING OF CONTROL LIMITS FOR GEOMETRIC CHART , 2000 .

[11]  Gemai Chen,et al.  THE MEAN AND STANDARD DEVIATION OF THE RUN LENGTH DISTRIBUTION OF X̄ CHARTS WHEN CONTROL LIMITS ARE ESTIMATED Gemai Chen , 2003 .

[12]  Douglas C. Montgomery,et al.  Research Issues and Ideas in Statistical Process Control , 1999 .

[13]  Frederick Mosteller,et al.  Unbiased Estimates for Certain Binomial Sampling Problems with Applications , 1946 .

[14]  J. B. S. HALDANE,et al.  A Labour-saving Method of Sampling , 1945, Nature.

[15]  Charles W. Champ,et al.  The Performance of Exponentially Weighted Moving Average Charts With Estimated Parameters , 2001, Technometrics.

[16]  Eli A. Glushkovsky ‘On-line’ G-control chart for attribute data , 1994 .