Quantifying Temperature-Dependent Substrate Loss in GaN-on-Si RF Technology
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P. Tasker | A. Eblabla | K. Elgaid | M. Uren | Martin Kuball | J. Pomeroy | Hareesh Chandrasekar | H. Hirshy | M. Casbon
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P. Tasker | A. Eblabla | K. Elgaid | M. Uren | Martin Kuball | J. Pomeroy | Hareesh Chandrasekar | H. Hirshy | M. Casbon