论文信息 - Single Event Testing of SDRAM, DDR2 and DDR3 Memories

Single Event Testing of SDRAM, DDR2 and DDR3 Memories

SEE test results are presented for SDRAM, DDR2, and DDR3. No tested devices exhibited SEL. SBUs were observed, but no MBUs were observed in data words. SEFI data were taken at low and high speed.

Mehran Amrbar | Steven M. Guertin

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