Measurement of the Γ‐L separation in Ga0.47In0.53As by ultraviolet photoemission
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Thomas P. Pearsall | A. Y. Cho | J. E. Rowe | A. Cho | K. Cheng | T. Pearsall | S. Christman | J. Rowe | K. Y. Cheng | S. B. Christman
[1] A. Cho,et al. Tin doping in Ga 0.47 In 0.53 As and Al 0.48 In 0.52 As grown by molecular-beam epitaxy , 1981 .
[2] J. Chevrier,et al. A Ga0.47In0.53As/InP heterophotodiode with reduced dark current , 1981, IEEE Journal of Quantum Electronics.
[3] P. M. Laufer,et al. Electroreflectance investigation of In1−xGaxAsyP1−y lattice-matched to InP , 1980 .
[4] E. Constant,et al. Comparative potential performance of Si, GaAs, GaInAs, InAs submicrometer-gate FET's , 1980, IEEE Transactions on Electron Devices.
[5] S. Christman,et al. Vidicon-camera parallel-detection system for angle-resolved electron spectroscopy. , 1979, The Review of scientific instruments.