Hot-carrier degradation caused interface state profile—Simulation versus experiment
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Tibor Grasser | Christoph Jungemann | Hajdin Ceric | Hubert Enichlmair | Ivan A. Starkov | Jong Mun Park | J. Cervenka | Stanislav Tyaginov | I. Starkov | T. Grasser | C. Jungemann | J. M. Park | H. Enichlmair | S. Carniello | S. Tyaginov | J. Cervenka | H. Ceric | Sara Carniello
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