Spectromicroscopy of Nanoscale Materials in the Tender X‐Ray Regime Enabled by a High Efficient Multilayer‐Based Grating Monochromator
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P. Guttmann | G. Schneider | R. Follath | Xinliang Feng | Qiushi Huang | S. Werner | Jian Zhang | M. Mast | F. Senf | A. Sokolov | F. Siewert | Tongzhou Li | E. Zschech | Z. Wang | Yufei Feng | K. Kutukova | Zhohngquan Liao