Reduction of testing power with pulsed scan flip-flop for scan based testing
暂无分享,去创建一个
[1] Kaushik Roy,et al. Low-Power CMOS VLSI Circuit Design , 2000 .
[2] Yu Chien-Cheng. Design of Low-Power Double Edge-Triggered Flip-Flop Circuit , 2007, 2007 2nd IEEE Conference on Industrial Electronics and Applications.
[3] Atul K. Jain,et al. Minimizing power consumption in scan testing: pattern generation and DFT techniques , 2004 .
[4] Kozo Kinoshita,et al. On low-capture-power test generation for scan testing , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).
[5] Bashir M. Al-Hashimi,et al. Power-constrained testing of VLSI circuits , 2003 .
[6] Peiyi Zhao,et al. Low power and high speed explicit-pulsed flip-flops , 2002, The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..
[7] Arnaud Virazel,et al. Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles , 2005, VLSI-SoC.
[8] Mango Chia-Tso Chao,et al. Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes , 2008, 26th IEEE VLSI Test Symposium (vts 2008).
[9] Manoj Sharma,et al. An Area and Power Efficient Design of Single Edge Triggered D-Flip Flop , 2009, 2009 International Conference on Advances in Recent Technologies in Communication and Computing.
[10] Janusz Rajski,et al. Low Power Scan Shift and Capture in the EDT Environment , 2008, 2008 IEEE International Test Conference.
[11] Ali Afzali-Kusha,et al. Low-power single- and double-edge-triggered flip-flops for high-speed applications , 2005 .
[12] Vladimir Stojanovic,et al. Comparative analysis of master-slave latches and flip-flops for high-performance and low-power systems , 1999, IEEE J. Solid State Circuits.
[13] Massoud Pedram,et al. Power minimization in IC design: principles and applications , 1996, TODE.