Scaling scenario of floating body cell (FBC) suppressing Vth variation due to random dopant fluctuation
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Akihiro Nitayama | Ryo Fukuda | Takashi Ohsawa | Takeshi Hamamoto | Yoshihiro Minami | Tomoaki Shino | Hiroomi Nakajima | Tomoki Higashi | Fumiyoshi Matsuoka | A. Nitayama | T. Shino | Y. Minami | F. Matsuoka | H. Nakajima | H. Furuhashi | K. Fujita | K. Fujita | T. Higashi | T. Hamamoto | T. Ohsawa | R. Fukuda | H. Furuhashi
[1] T. Hiramoto,et al. Impact of Parameter Variations and Random Dopant Fluctuations on Short-Channel Fully Depleted SOI MOSFETs With Extremely Thin BOX , 2007, IEEE Electron Device Letters.