Analog Circuit Testing Using Built-In Direct-Digital Synthesis
暂无分享,去创建一个
[1] Lee Y. Song. Mixed signal BIST: fact or fiction , 2002, Proceedings. International Test Conference.
[2] Foster F. Dai,et al. A novel DDS architecture using nonlinear ROM addressing with improved compression ratio and quantisation noise , 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).
[3] Gordon W. Roberts,et al. A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC , 1994, Proceedings of IEEE VLSI Test Symposium.
[4] Seongwon Kim,et al. Hierarchical ATPG for Analog Circuits and Systems , 2001, IEEE Des. Test Comput..
[5] Joseph A. Mielke. Frequency Domain Testing of ADCs , 1996, IEEE Des. Test Comput..
[6] Gordon W. Roberts,et al. A built-in self-test strategy for wireless communication systems , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[7] Hung-Jen Lin,et al. Optimal testing of VLSI analog circuits , 1997, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[8] Francesco Corsi,et al. A fault signature approach to analog devices testing , 1993, Proceedings ETC 93 Third European Test Conference.