论文信息 - Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties - 字舞流文

Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties

F. Fages | C. Becker | F. Bocquet | L. Nony | F. Para | C. Loppacher | Jean‐Valère Naubron | A. D'Aléo | Philipda Luangprasert | T. Leoni | Anthony W. Thomas | A. Ranguis | Thomas Leoni