Split post dielectric resonator technique for precise measurements of laminar dielectric specimens-measurement uncertainties
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Jerzy Krupka | R. N. Clarke | A. P. Gregory | R. Clarke | J. Krupka | A. Gregory | O. C. Rochard | O. Rochard
[1] Jerzy Krupka,et al. A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature , 1998 .
[2] Michael E. Tobar,et al. Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures , 1999 .
[3] Jerzy Krupka,et al. Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques , 1996 .
[4] K. Wakino,et al. Precise Measurement Method for Complex Permittivity of Microwave Dielectric Substrate , 1988, 1988 Conference on Precision Electromagnetic Measurements.