Test features of a core-based co-processor array for video applications
暂无分享,去创建一个
[1] Bart Vermeulen,et al. Silicon debug: scan chains alone are not enough , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[2] Sujit Dey,et al. A low overhead design for testability and test generation technique for core-based systems , 1997, Proceedings International Test Conference 1997.
[3] Yervant Zorian,et al. Testing embedded-core based system chips , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[4] Erik Jan Marinissen,et al. A structured and scalable mechanism for test access to embedded reusable cores , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[5] Srinivas Raman,et al. Direct access test scheme-design of block and core cells for embedded ASICs , 1990, Proceedings. International Test Conference 1990.
[6] M. Lousberg,et al. The role of test protocols in testing embedded-core-based system ICs , 1999, European Test Workshop 1999 (Cat. No.PR00390).
[7] Yervant Zorian,et al. Challenges in testing core-based system ICs , 1999, IEEE Commun. Mag..