Test features of a core-based co-processor array for video applications

This paper describes the Design for Testability and test synthesis of a modular video-processing chip named Co-Processor Array (CPA). A core-based test method has been implemented to enable efficient test pattern generation and verification. The main challenges of this work are the test clock strategy, test control, Design for Testability for the various blocks and busses, and test protocol expansion and simulation at chip-level. The core-based test strategy proved to be well suited for integrated circuits with a modular structure like the CPA. Reduction of time-to-market for redesigns and new versions is achieved with this method by reusing cores including Design for Testability and test pattern generation.

[1]  Bart Vermeulen,et al.  Silicon debug: scan chains alone are not enough , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[2]  Sujit Dey,et al.  A low overhead design for testability and test generation technique for core-based systems , 1997, Proceedings International Test Conference 1997.

[3]  Yervant Zorian,et al.  Testing embedded-core based system chips , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[4]  Erik Jan Marinissen,et al.  A structured and scalable mechanism for test access to embedded reusable cores , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[5]  Srinivas Raman,et al.  Direct access test scheme-design of block and core cells for embedded ASICs , 1990, Proceedings. International Test Conference 1990.

[6]  M. Lousberg,et al.  The role of test protocols in testing embedded-core-based system ICs , 1999, European Test Workshop 1999 (Cat. No.PR00390).

[7]  Yervant Zorian,et al.  Challenges in testing core-based system ICs , 1999, IEEE Commun. Mag..