论文信息 - Electrical characterization of deep levels existing in Mg-Si- and Mg-P-Si-implanted n InP junctions - 字舞流文

Electrical characterization of deep levels existing in Mg-Si- and Mg-P-Si-implanted n InP junctions

J. M. Martín | R. Pinacho | J. Barbolla | S. Dueñas | G. González-Díaz | E. Castán | R. Peláez | L. Quintanilla | Jaime M. Martin | R. Peláez