Pick-and-place nanomanipulation with three-dimensional manipulation force microscopy

Applications of the conventional atomic force microscope (AFM) succeeded in manipulating nanoparticles, nanowires or nanotubes by widely used pushing or pulling operations on a single plane. However, pick-and-place nanomanipulation is still a challenge in the air. In this paper, a modified AFM, called three-dimensional (3D) manipulation force microscope (3DMFM) was developed, aiming to achieve the pick-and-place in the air. This system mainly consists of two microcantilevers and each is quipped with a nanopositioning device and an optical lever, constructing a nanotweezer with capabilities of picking and releasing nanoobjects with force sensing. Before the 3D manipulation, one of the cantilevers is employed to position nanoobjects and locate the tip of another cantilever by image scanning, then these two cantilevers fit together as a nanotweezer to grasp, transport and place the nanoobjects with real-time force sensing. In pick-and-place experiments, silicon nanowires (SiNMs) with different diameters were manipulated and 3D nanowire crosses were achieved. 3D nanomanipulation and nanoassembly in the air could become feasible through the newly developed 3DMFM.

[1]  Fumihito Arai,et al.  Electron-beam-induced deposition with carbon nanotube emitters , 2002 .

[2]  Aristides A. G. Requicha,et al.  Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation , 2008, IEEE Transactions on Automation Science and Engineering.

[3]  Robert W. Carpick,et al.  Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization , 2006 .

[4]  Sanghun Kim,et al.  Manipulation of freestanding Au nanogears using an atomic force microscope , 2007 .

[5]  D. Eigler,et al.  Positioning single atoms with a scanning tunnelling microscope , 1990, Nature.

[6]  F. Arai,et al.  Destructive constructions of nanostructures with carbon nanotubes through nanorobotic manipulation , 2004, IEEE/ASME Transactions on Mechatronics.

[7]  Kim,et al.  Nanotube nanotweezers , 1999, Science.

[8]  Fumihito Arai,et al.  Assembly of nanodevices with carbon nanotubes through nanorobotic manipulations , 2003, Proc. IEEE.

[9]  K. Mølhave,et al.  Pick-and-place nanomanipulation using microfabricated grippers , 2006, Nanotechnology.

[10]  Aristides A. G. Requicha,et al.  Nanoparticle manipulation by mechanical pushing: underlying phenomena and real-time monitoring , 1998 .

[11]  R. Celotta,et al.  Manipulation of Adsorbed Atoms and Creation of New Structures on Room-Temperature Surfaces with a Scanning Tunneling Microscope , 1991, Science.

[12]  Richard Superfine,et al.  Fabrication of nanometer-scale mechanical devices incorporating individual multiwalled carbon nanotubes as torsional springs , 2003 .

[13]  Madhukar,et al.  Manipulation of gold nanoparticles in liquid environments using scanning force microscopy , 2000, Ultramicroscopy.

[14]  Stephane Regnier,et al.  Simulation of micro-manipulations: Adhesion forces and specific dynamic models , 1999 .

[15]  Ting Yu,et al.  The manipulation and assembly of CuO nanorods with line optical tweezers , 2004 .

[16]  Thomas Aabo,et al.  Efficient optical trapping and visualization of silver nanoparticles. , 2008, Nano letters.

[17]  P. Avouris.  Manipulation of Matter at the Atomic and Molecular Levels , 1995 .

[18]  K. Kuhnen,et al.  Inverse control of systems with hysteresis and creep , 2001 .

[19]  N. Amer,et al.  Novel optical approach to atomic force microscopy , 1988 .

[20]  Yoon Keun Kwak,et al.  Nanoscale fabrication of a single multiwalled carbon nanotube attached atomic force microscope tip using an electric field , 2005 .

[21]  H. Hashimoto,et al.  Controlled pushing of nanoparticles: modeling and experiments , 2000 .

[22]  Izhak Etsion,et al.  An improved wedge calibration method for lateral force in atomic force microscopy , 2003 .

[23]  R. Superfine,et al.  Nanometre-scale rolling and sliding of carbon nanotubes , 1999, Nature.