Standard Test Protocol to Characterize Adjustable Speed Drive Behavior During Voltage Dips

Susceptibility of adjustable speed drives (ASD) against voltage dips it’s been a red-hot issue in the last years. European standards concerning electromagnetic compatibility in the section of voltage dips don’t allow characterization of ASD performance when a voltage dip occurs. Papers published about this subject are focused on the theoretical study of the effects of dips on ASD and alternative methods for testing voltage dip immunity of this equipment. But in the former, only undervoltage trip has been usually taken into account; and, in the latter, the criterion used to decide when the ASD fails is not suitable in all cases. Firstly this paper will briefly analyze why an ASD trips when there is a voltage dip. Secondly a test will be proposed with two main goals: (a) to offer a novel, simplified and affordable test protocol, and (b) to achieve test results useful for ASD users. To accomplish this second goal, energetic inmunity and control inmunity will be introduced to take into account process necessities where ASD is integrated.