Laser direct writing of tungsten from WF6

Abstract We present recent results on the development of laser direct writing of tungsten from WF 6 on silicon oxynitride (SiO x N y ), titanium nitride (TiN) and galium arsenide (GaAs). Ar + laser processing from WF 6 and H 2 on (SiO x N y ) produces low resistivity (13 μω cm) pure tungsten lines having widths as low as 2.5 μm. Deposition on GaAs using the Ar + laser occurs in a very narrow process window and is found to be irreproducible. Surface analysis suggests that a spontaneous reaction between WF 6 and GaAs, producing GaF 3 , takes place. This reaction may poison the initiation of the deposition. Finally, in order to develop a compact and inexpensive laser direct writing system, we have also investigated the use of a diode laser as the heat source. Diode laser processing from WF 6 and SiH 4 on TiN yields WSi x ( x = 0.7−0.9) lines having widths as low as 4 μm.

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