Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision
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J. Miao | P. Ajayan | Y. Gong | Shi-ze Yang | Xuezeng Tian | J. Idrobo | Yakun Yuan | P. Narang | Yongsoo Yang | C. Ciccarino | Dennis S. Kim | Yao Yang | Blake Duschatko | Blake R. Duschatko
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