A page lifetime-aware scrubbing scheme for improving reliability of Flash-based SSD

Solid-state drive (SSD) has gain prevalence in consumer and enterprise storage markets. However, its reliability is declining with the wearing of the Flash memory. The error correcting codes (ECCs) are generally applied in SSD to cope with bit errors caused by abrasion, however, the lifetime of pages in Flash is still limited to their fixed correctability. Due to different process and usage, the pages of Flash deteriorate in different speeds, which limited the service time of SSD. In order to prolong the lifetime of SSD, we proposed a Page Lifetime-aware Scrubbing (LaScrub) scheme to find dangerous pages which exist more bit errors. The simulation results show the proposed scheme is able to enhance the reliability of SSD. It gains 86% storage space compared with normal SSD at the same reliability requirement.

[1]  Xavier Jimenez,et al.  Wear unleveling: improving NAND flash lifetime by balancing page endurance , 2014, FAST.

[2]  Onur Mutlu,et al.  Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis , 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[3]  Rina Panigrahy,et al.  Design Tradeoffs for SSD Performance , 2008, USENIX ATC.

[4]  Sanghyuk Jung,et al.  FRA: a flash-aware redundancy array of flash storage devices , 2009, CODES+ISSS '09.

[5]  Bianca Schroeder,et al.  Practical scrubbing: Getting to the bad sector at the right time , 2012, IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012).

[6]  Onur Mutlu,et al.  Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery , 2015, 2015 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks.

[7]  Werner Bux,et al.  Performance of greedy garbage collection in flash-based solid-state drives , 2010, Perform. Evaluation.

[8]  Evangelos Eleftheriou,et al.  Disk Scrubbing Versus Intradisk Redundancy for RAID Storage Systems , 2011, TOS.

[9]  Tong Zhang,et al.  Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes , 2013, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[10]  Li-Pin Chang,et al.  On efficient wear leveling for large-scale flash-memory storage systems , 2007, SAC '07.

[11]  Dongkun Shin,et al.  Flash-Aware RAID Techniques for Dependable and High-Performance Flash Memory SSD , 2011, IEEE Transactions on Computers.