Er3+-doped tellurite waveguides deposited by excimer laser ablation

This paper reports on the optical properties of Erbium-doped zinc–tellurite (TeO 2–ZnCl2–ZnO) oxyhalide glass waveguides, deposited by reactive pulsed laser deposition (RPLD) on silica substrates. Er 3+ -doped zinc–tellurite glass (ZT) targets were ablated in oxygen dynamical flow at two different pressure values of 5 and 10 Pa by ArF excimer laser at the fluence of 3.7 J/cm 2 . The waveguiding properties of the deposited films were investigated by the m-line technique. The TE 0 mode excitation was used for photoluminescence (PL) and Raman measurements, in order to study the Erbium ion 4 I13/2 → 4 I15/2 transition and structural properties of the deposited films, respectively. Optical band gap and wavelength dependence of the real and imaginary parts of the refractive index were

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