论文信息 - Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [STUB] - 字舞流文

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [STUB]

Anthony M. Phan | Melanie D. Berg | Hak Kim

[1] Gary Swift,et al. Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation , 2014, 2015 IEEE Radiation Effects Data Workshop (REDW).