Stresses in vacuum glazing fabricated at low temperature

This paper reports an experimental and theoretical study of the stresses in and durability of vacuum glazing fabricated at low temperature using an indium based edge seal. For the first time a finite-element model with support pillars incorporated directly, enabled the stresses in the whole structure to be explicitly calculated. Experimental validations of the finite element model predictions were undertaken. Modelling results are presented for a case with American Society of Testing and Materials standard winter boundary conditions. It was found that, for the particular system studied, the predicted stress level in the structure is essentially the same for indium sealed and solder glass sealed vacuum glazing, and the magnitude of stress values in the indium seal is comparable with that dictated by the indium strength characteristics.

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