论文信息 - Sine wave artifact as a means of calibrating structured light systems

Sine wave artifact as a means of calibrating structured light systems

Structured light systems made to provide dense data over full image fields present a unique challenge to the task of calibration. Localized artifacts made for CMM or hard gages are often a poor fit for testing actual 3D performance. This paper considers the use of a sine wave artifact to provide a mapping of a calibration matched to full-field capabilities. The sine wave offers the advantages of a continuous function across the full field, with a well defined and easy to analyze shape. Changes in scale in all dimensions, as well as localized variations can be mapped in clear detail using this method.

Kevin G. Harding

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