Thresholds for Size and Complexity Metrics: A Case Study from the Perspective of Defect Density
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Audris Mockus | Naoyasu Ubayashi | Yasutaka Kamei | Ahmed E. Hassan | Meiyappan Nagappan | Kazuhiro Yamashita | Changyun Huang | A. Mockus | A. Hassan | M. Nagappan | Yasutaka Kamei | Kazuhiro Yamashita | Naoyasu Ubayashi | Changyun Huang
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