Metrics, techniques and recent developments in mixed-signal testing
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[1] Wojciech Maly,et al. Realistic Fault Modeling for VLSI Testing , 1987, 24th ACM/IEEE Design Automation Conference.
[2] Wojciech Maly,et al. FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS , 1991, 1991, Proceedings. International Test Conference.
[3] Gordon W. Roberts,et al. A BIST scheme for an SNR test of a sigma-delta ADC , 1993, Proceedings of IEEE International Test Conference - (ITC).
[4] A. Osseiran. Getting to a test standard for mixed-signal boards , 1995, 38th Midwest Symposium on Circuits and Systems. Proceedings.
[5] Salvador Mir,et al. Concurrent error detection in analog and mixed-signal integrated circuits , 1995, 38th Midwest Symposium on Circuits and Systems. Proceedings.
[6] Matthew V. Mahoney. New Techniques for High Speed Analog Testing , 1983, ITC.
[7] Gordon W. Roberts,et al. An integration of memory-based analog signal generation into current DFT architectures , 1998, IEEE Trans. Instrum. Meas..
[8] S. Bracho,et al. Current test methods in mixed signal circuits , 1995, 38th Midwest Symposium on Circuits and Systems. Proceedings.
[9] Brendan Davis,et al. Economic modeling of board test strategies , 1994, J. Electron. Test..
[10] H. Kitayoshi,et al. DSP Synthesized Signal Source for Analog Testing Stimulus and New Test Method , 1985, ITC.
[11] Gordon W. Roberts,et al. A built-in self-test strategy for wireless communication systems , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[12] A. Sangiovanni-Vincentelli,et al. Optimal test set design for analog circuits , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[13] Patrick D.T. O'Connor. The Economics of Automatic Testing , 1983 .
[14] Matthew Mahoney,et al. DSP-Based Testing of Analog and Mixed-Signal Circuits , 1987 .
[15] Gordon W. Roberts,et al. Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits , 1995 .
[16] Steven D. Millman. Improving quality: Yield versus test coverage , 1994, J. Electron. Test..
[17] Manoj Sachdev,et al. Industrial relevance of analog IFA: a fact or a fiction , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[18] J. Goodman,et al. Fourier Transforms: An Introduction for Engineers , 2012 .