Graphene-based sample supports for in situ high-resolution TEM electrical investigations
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J. Meyer | E. Kohn | U. Kaiser | C. Krill | F. Scholz | J. Kusterer | G. Algara-Siller | J. Biskupek | B Westenfelder | J Biskupek | G Algara-Siller | L G Lechner | U Kaiser | C E Krill | F Scholz | L. Lechner | B. Westenfelder